High uniform growth of 4-inch GaN wafer via flow field optimization by HVPE

Publication date: 1 July 2016
Source:Journal of Crystal Growth, Volume 445
Author(s): Yutian Cheng, Peng Liu, Jiejun Wu, Yong Xiang, Xinjuan Chen, Cheng Ji, Tongjun Yu, Guoyi Zhang
The uniformity of flow field inner the reactor plays a crucial role for hydride vapor phase epitaxy (HVPE) crystal growth and its more important for large scale substrate. A new nozzle structure was designed by adding a push and dilution (PD) gas pipe in the center of gas channels for a 4-inch HVPE (PD-HVPE) system. Experimental results showed that the thickness inhomogeneity of 46μm 4-inch GaN layer could reach ±1.8% by optimizing PD gas, greatly improved from ±14% grown with conventional nozzle. The simulations of the internal flow field were consistent with our experiment, and the enhancement in uniformity should be attributed to the redistribution of GaCl and NH3 upon the wafer induced by PD pipe. The full width at half maximum (FWHM) of X-ray diffraction rocking curves for the 4-inch GaN film were about 224 and 200arcsec for (002) and (102) reflection. The dislocation density of as-grown GaN was about 6.4×10⁷cm⁻².



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